Supplementary data from the NIST  lattice comparator  associated with paper "The NIST Silicon Lattice Comparator Upgrade"
The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle.  All of it is collected and is stored in JSON files. The files are highly self-descriptive of their content, and contain angles, intensities, temperatures, and other environmental parameters, along with …