On-Wafer Device Characterization Including Uncertainty Estimates to 1.0 THz
data published in paper "On-Wafer Device Characterization Including Uncertainty Estimates to 1.0 THz"This dataset contains the calibrated scattering parameters (S-parameters) of a thru that  was not used in calibration, and the simulated and calibrated S-parameters for series and shunt capacitors for both technology 1 …