Interpretation of the thickness of Quaternary deposits on the inner-continental shelf within the New York Bight, derived from seismic data collected by the U.S. Geological Survey, 1995 - 1999 (Grid, UTM Zone 18N, WGS84 and Esri polyline shapefile, Geographic, WGS84)
Mapping the thickness of the Quaternary sediment is useful
for delineating the geologic framework of the New York Bight
inner-continental shelf. This in turn aids in understanding
the stratigraphic evolution of the inner-continental shelf,
the regional sediment transport system, and the influence of
the inner-shelf …